Making graphene visible
Making graphene visible
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DOI：
10.1063/1.2768624
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发表时间：
2007-08-06
影响因子：
4
通讯作者：
Geim, A. K.
中科院分区：
文献类型：
--
作者：
Blake, P.;Hill, E. W.;Geim, A. K.
目前许多实验研究中使用的石墨烯器件的微加工依赖于这样一个事实：如果将石墨烯微晶制备在具有一定厚度二氧化硅层的硅片上，就可以使用光学显微镜对其进行观察。作者研究了石墨烯的可见性，并表明它在很大程度上取决于二氧化硅的厚度和光的波长。他们发现，通过使用单色光照明，对于任何二氧化硅厚度，石墨烯都可以被分辨出来，尽管300纳米（当前的标准），尤其是接近100纳米的厚度最适合对其进行视觉检测。通过使用一个基于菲涅耳定律的模型，他们对实验数据进行了定量描述。（c）2007美国物理学会
Microfabrication of graphene devices used in many experimental studies currently relies on the fact that graphene crystallites can be visualized using optical microscopy if prepared on top of Si wafers with a certain thickness of SiO2. The authors study graphene's visibility and show that it depends strongly on both thickness of SiO2 and light wavelength. They have found that by using monochromatic illumination, graphene can be isolated for any SiO2 thickness, albeit 300 nm (the current standard) and, especially, approximate to 100 nm are most suitable for its visual detection. By using a Fresnel-law-based model, they quantitatively describe the experimental data. (c) 2007 American Institute of Physics.