Orientation dependence of ferroelectric and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin films on Pt(100)/TiO2/SiO2/Si substrates
Orientation dependence of ferroelectric and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin films on Pt(100)/TiO2/SiO2/Si substrates
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DOI：
10.1063/1.2364668
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发表时间：
2006-11-01
影响因子：
3.2
通讯作者：
Hu, G. D.
中科院分区：
文献类型：
--
作者：
Hu, G. D.
采用金属有机物分解法在Pt（100）/TiO 2/SiO2/Si衬底上制备了（100）[α（100））=87.8%]、（117）[α（117））=77.1%]和（001）[α（001））=98.8%]择优取向的Bi3.15Nd0.85Ti3O12（BNT 0.85）薄膜。（100）取向的BNT 0.85薄膜的反射极化分别比（117）取向和（001）取向的薄膜大50%和3倍，表明BNT 0.85薄膜的主极化矢量接近a轴而不是c轴。这一结果可以进一步证明了压电测量使用原子力显微镜在piezoresponse模式。(c)2006年，美国物理学会。
Bi3.15Nd0.85Ti3O12 (BNT0.85) thin films with (100) [alpha((100))=87.8%], (117) [alpha((117))=77.1%], and (001) [alpha((001))=98.8%] preferred orientations were deposited on Pt(100)/TiO2/SiO2/Si substrates using a metal organic decomposition process. The remanent polarization of (100)-predominant BNT0.85 film is about 50% and three times larger than those of (117)-preferred and (001)-oriented films, respectively, suggesting that the major polarization vector of BNT0.85 is close to the a axis rather than the c axis. This result can be further demonstrated by the piezoelectric measurements using an atomic force microscope in the piezoresponse mode. (c) 2006 American Institute of Physics.