Computer program PARAV for calculating optical constants of thin films and bulk materials : Case study of amorphous semiconductors
Computer program PARAV for calculating optical constants of thin films and bulk materials : Case study of amorphous semiconductors
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用于计算薄膜和块体材料光学常数的计算机程序 PARAV：非晶半导体案例研究
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
R. Golovchak
中科院分区：
文献类型：
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作者：
A. Ganjoo;R. Golovchak
用于计算各种光学常数的计算机程序“PARAV”，例如，从实验测量的块状材料和薄膜的透射光谱，发展了折射率、光吸收系数、光学厚度和光学带隙的色散。用户界面友好，方便的输入和输出的测量和计算数据的文本文件的形式也是该软件的一个特点。以非晶半导体（硫系玻璃、薄膜和a-Si：H）的数据为例，验证了程序的可靠性。
A computer program "PARAV" for calculating various optical constants, e.g., the dispersion of refractive index, optical absorption coefficient, optical thickness and optical bandgap, from experimentally measured transmission spectra of bulk materials and thin films is developed. User-friendly interface, convenient input and output of the measured and calculated data in the form of text files are also a feature of this software. Data from amorphous semiconductors (chalcogenide glasses and thin films and a-Si:H) are used as typical examples to check the reliability of the program.