Understanding and Comparing the Capabilities of On-Chip Voltage Sensors against Remote Power Attacks on FPGAs
Understanding and Comparing the Capabilities of On-Chip Voltage Sensors against Remote Power Attacks on FPGAs
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DOI：
10.1109/mwscas48704.2020.9184683
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发表时间：
2020-08
期刊：
影响因子：
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通讯作者：
Shayan Moini;Xiang Li;Peter Stanwicks;George Provelengios;W. Burleson;R. Tessier;Daniel E. Holcomb
中科院分区：
文献类型：
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作者：
Shayan Moini;Xiang Li;Peter Stanwicks;George Provelengios;W. Burleson;R. Tessier;Daniel E. Holcomb
本文提出了两种类型的片上FPGA电压传感器的研究分别基于环形振荡器（RO）和时间数字转换器（TDC）。这些传感器的性能是在存在故意浪费功率的电路的情况下进行评估的，从而导致局部电压下降。针对Xilinx阿蒂克斯-7和Zynq UltraScale+ FPGA，评估了FPGA电源特性和传感器灵敏度对检测FPGA配电网络（PDN）中电压降的影响。我们表明，这两种传感器类型都能够检测电源电压降，并且它们的测量结果是一致的。然而，我们发现基于TDC的传感器更灵敏，可以检测持续时间更短的电压降，而RO传感器具有更高的动态范围，并且更容易实现，因为不需要校准。
This paper presents a study of two types of on-chip FPGA voltage sensors based on ring oscillators (ROs) and time-to-digital converter (TDCs), respectively. The performance of these sensors is evaluated in the presence of circuits that deliberately waste power, resulting in localized voltage drops. The effects of FPGA power supply features and sensor sensitivity in detecting voltage drops in an FPGA power distribution network (PDN) are evaluated for Xilinx Artix-7 and Zynq UltraScale+ FPGAs. We show that the two sensor types are both able to detect supply voltage drops, and that their measurements are consistent with each other. However, we find that TDC-based sensors are more sensitive and can detect voltage drops that are shorter in duration, while RO sensors have a higher dynamic range and are easier to implement because calibration is not required.