Physical properties of the CNT:TiO2 thin films prepared by sol-gel dip coating
Physical properties of the CNT:TiO2 thin films prepared by sol-gel dip coating
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DOI：
10.1016/j.solener.2011.06.027
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发表时间：
2012-04-01
期刊：
影响因子：
6.7
通讯作者：
Mathew, Xavier
中科院分区：
文献类型：
--
作者：
Morales, Erik R.;Mathews, N. R.;Mathew, Xavier
采用溶胶-凝胶浸涂法合成了均匀且高附着力的CNT:TiO2薄膜。 TiO 和 CNT:TiO2 薄膜都表现出非常相同的结构特征，并且没有观察到晶格值的显着变化。晶体尺寸从 TiO2 薄膜的 20 nm 减小到 4%CNT:TiO2 薄膜的 17 nm。 AFM 测量得到的粗糙度数据表明，薄膜表面非常光滑致密；粗糙度的均方根 (rms) 平均值低至 3 nm。 HRTEM 显示 CNT 嵌入 TiO2 基体中，表明复合材料的形成。在拉曼光谱中，确定了 TiO2 的特征振动，在 4%CNT:TiO2 薄膜的情况下，主锐钛矿峰 (144 cm(-1)) 的 FWHM 增加被解释为由于薄膜中掺入了 CNT。在600 nm 波长处，纯TiO2 的折射率为2.07，4%CNT:TiO2 的折射率为2.29。光响应曲线显示了薄膜带隙中电荷捕获中心的典型特征。 (C) 2011 Elsevier Ltd. 保留所有权利。
Uniform and highly adherent thin films of CNT:TiO2 were synthesized by sol-gel dip coating method. Both TiO, and CNT:TiO2 films showed very identical structural characteristics and no significant changes in the lattice values were observed. The crystalline size decreased from 20 nm for TiO2 film to 17 nm for the 4%CNT:TiO2 film. The film surface was very smooth and compact, as indicated by the roughness data obtained from AFM measurements; the root mean square (rms) average of the roughness was as low as 3 nm. The HRTEM showed that the CNTs are embedded in the matrix of TiO2 indicating the formation of a composite. In Raman spectra the characteristic vibrations of the TiO2 are identified, the increase in the FWHM of main anatase peak (144 cm(-1)) in the case of the 4%CNT:TiO2 film is interpreted as due to the incorporation of CNTs in the film. At the wavelength of 600 nm the refractive index of pure TiO2 was 2.07 and the 4%CNT:TiO2 showed a value of 2.29. The photoresponse curves showed typical features of charge trapping centers in the band gap of the films. (C) 2011 Elsevier Ltd. All rights reserved.