Contrast analysis of near-field scanning microscopy using a metal slit probe at millimeter wavelengths
Contrast analysis of near-field scanning microscopy using a metal slit probe at millimeter wavelengths
复制标题
DOI：
10.1063/1.4931149
复制
发表时间：
2015-09
影响因子：
3.2
通讯作者：
T. Nozokido;M. Ishino;R. Seto;J. Bae
中科院分区：
文献类型：
--
作者：
T. Nozokido;M. Ishino;R. Seto;J. Bae
我们描述了一种分析方法，用于调查在近场扫描显微镜使用金属狭缝探针获得的信号对比度。探头在矩形或平行板波导的开口端有一个狭缝状的孔径。在我们的方法中，在探针尖端的金属狭缝孔径周围的电磁场计算从麦克斯韦方程在傅立叶域中，以获得从探针尖端所看到的样品系统的电导纳的分层的。一个简单的两端口电路终止于此导纳，然后建立计算作为信号的探头的复反射系数。该方法的有效性在毫米波波段的全波高频三维有限元建模和实验验证。当改变狭缝孔径的短尺寸时，信号对比度，探针尖端和样品之间的分离，以及样品厚度成功地解释在变量方面。
We describe an analytical method for investigating the signal contrast obtained in near-field scanning microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular or a parallel plate waveguide. In our method, the electromagnetic field around the metal slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. A simple two-port electrical circuit terminated by this admittance is then established to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified at millimeter wavelengths by a full-wave high frequency 3-D finite element modeler and also by experiment. The signal contrast when varying the short dimension of the slit aperture, the separation between the probe tip and the sample, and the sample thickness are successfully explained in terms of the va...