Using electron backscatter diffraction patterns to examine recrystallization in polar ice sheets
Using electron backscatter diffraction patterns to examine recrystallization in polar ice sheets
复制标题
使用电子背散射衍射图来检查极地冰盖的再结晶
DOI：
10.3189/172756506781828458
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发表时间：
2006
影响因子：
3.4
通讯作者：
K. Sieg
中科院分区：
文献类型：
--
作者：
R. Obbard;I. Baker;K. Sieg
多晶冰的结构通常仅使用c轴取向来描述，但这不足以完整描述这种六边形材料中的晶粒取向。电子背散射衍射（EBSD）提供了完整的c轴和a轴方向的个别颗粒，并在这里使用的格陵兰冰盖项目2（GISP2）冰标本从1551，1642和1745米的深度研究。完整的取向数据被用来比较最近邻的关系，整体结构和再结晶机制之间的区别。GISP2试样中晶粒和亚晶粒之间的取向变化与薄切片上的晶界外观相关，并用于识别可能由结晶化产生的晶粒集。考虑到c轴和a轴的差异与那些来自c轴方向单独的晶粒取向差的比较揭示了结晶的存在，并说明了这种技术的实用性。
The fabric of polycrystalline ice is typically described using the c-axis orientation alone, but this is insufficient for a full description of grain orientations in this hexagonal material. Electron backscatter diffraction (EBSD) provides full c- and a-axis orientation of individual grains, and is used here to study Greenland Ice Sheet Project 2 (GISP2) ice specimens from depths of 1551, 1642 and 1745 m. Complete orientation data are used to compare nearest-neighbor relationships to overall fabric and to differentiate between recrystallization mechanisms. Changes in orientation between grains and subgrains in GISP2 specimens were correlated with the appearance of grain boundaries on thin sections and used to identify grain sets that were probably produced by polygonization. Comparison of grain misorientations that take into account both c- and a-axis differences with those derived from c-axis directions alone reveals the presence of polygonization and illustrates the usefulness of this technique.