Photoemission measurement of extremely insulating materials: Capacitive photocurrent detection in photoelectron yield spectroscopy
Photoemission measurement of extremely insulating materials: Capacitive photocurrent detection in photoelectron yield spectroscopy
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DOI：
10.1063/1.2908888
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发表时间：
2008-04-14
影响因子：
4
通讯作者：
Ishii, Hisao
中科院分区：
文献类型：
--
作者：
Nakayama, Yasuo;Machida, Shinichi;Ishii, Hisao
已经使用光电发射测量研究了各种材料的电子结构。然而，样品充电问题限制了这些测量在绝缘材料上的应用。在这项研究中，我们提出了一种电容式光电流检测方法，该方法允许在真空和环境压力条件下对极其绝缘的材料进行光电子产率光谱测量。讨论了检测机制，并演示了在云母基底上的金和红荧烯薄膜中的应用。 (C) 2008 年美国物理研究所。
The electronic structures of various materials have been investigated using photoemission measurements. The sample charge-up problem, however, limits the application of these measurements to insulating materials. In this study, we propose a capacitive photocurrent detection method that permits photoelectron yield spectroscopy measurements of extremely insulating materials in both vacuum and ambient pressure conditions. The mechanism of detection is discussed, and the application to gold and rubrene films on mica substrates is demonstrated. (C) 2008 American Institute of Physics.