Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode
Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode
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DOI:
10.1103/physrevb.70.024426
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发表时间:
2004-07
影响因子:
3.7
通讯作者:
J. Schmalhorst;S. Kämmerer;M. Sacher;G. Reiss;A. Hütten;A. Scholl
中科院分区:
文献类型:
--
作者:
J. Schmalhorst;S. Kämmerer;M. Sacher;G. Reiss;A. Hütten;A. Scholl
Magnetic tunnel junctions with a magnetically soft Heusler-alloy electrode (Co2MnSi/Al+oxidation+in situ annealing/Co7Fe3/Mn83Ir17) and a maximal tunnel magnetoresistance effect of 86% at 10 K/10 mV are investigated with respect to their structural and magnetic properties at the lower barrier interface by electron and x-ray absorption spectroscopy. A plasma-oxidation-induced Mn/Si segregation and oxide formation at the barrier interface is found, which results in a strongly increased area-resistance product of the junctions, because of an enlarged barrier thickness. For Co2MnSi thickness equal to 8 nm or larger, ferromagnetic order of Mn and Co spins at the interface is induced by annealing; simultaneously, atomic ordering at the interface is observed. The influence of the structural and magnetic interface properties on the temperature-dependent transport properties of the junctions is discussed.