Grazing angle mirror-backed reflection (GMBR) for infrared analysis of monolayers on silicon
Grazing angle mirror-backed reflection (GMBR) for infrared analysis of monolayers on silicon
复制标题
用于硅单层红外分析的掠角镜面反射 (GMBR)
DOI：
10.1021/jp063467q
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发表时间：
2006-09-14
影响因子：
3.3
通讯作者：
Gu, Zhong-Ze
中科院分区：
文献类型：
--
作者：
Liu, Hong-Bo;Xiao, Shou-Jun;Gu, Zhong-Ze
建立了一种简单易行的红外测量方法-掠角背反射法（GMBR），用于分析硅基有机单层膜。理论预测给出了最佳配置与p偏振照射附近的掠入射角78.1。氢封端的十一碳烯酸（UA）和N-羟基琥珀酰亚胺（NHS）官能化的硅（111）表面的实验测量显示出良好的信号峰和再现性。
An easy handling infrared measurement, grazing angle mirror-backed reflection (GMBR), has been established to analyze the silicon-based organic monolayer. Theoretical prediction gave the optimal configuration with p-polarized irradiation near a grazing angle 78.1 of incidence. Experimental measurement of hydrogenterminated, undecylenic acid (UA) and N-hydroxysuccinimide (NHS) functionalized silicon (111) surfaces showed good signal peaks and reproducibility.