Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
复制标题
通过超高压退火在 GaN 中注入 Mg 的原子尺度研究
DOI:
10.1063/5.0087248
复制
发表时间:
2022
影响因子:
3.2
通讯作者:
K. Hono
中科院分区:
文献类型:
--
作者:
Jun Uzuhashi;Jun Chen;Ashutosh Kumar;W. Yi;T. Ohkubo;R. Tanaka;S. Takashima;M. Edo;K. Sierakowski;M. Boćkowski;Hideki Sakurai;T. Kachi;T. Sekiguchi;K. Hono
An area selective doping via ion implantation is a key technology to realize gallium nitride (GaN) based energy-efficient power devices; however, conventional annealing leads to the formation of numerous Mg-enriched defects, which result in inefficient p-type activation. The recent invention of ultra-high-pressure annealing (UHPA) has enabled a significant improvement in p-type activation efficiency. In this study, we investigated the formation of Mg-enriched defects in Mg implanted GaN followed by annealing under either conventional atmospheric pressure or ultra-high-pressure. Unlike the conventional annealing, UHPA leads to a much lower number density of Mg-enriched defects. Correlative scanning transmission electron microscopy, atom probe tomography, cathodoluminescence, and secondary ion mass spectrometry analyses have shown that the number density of Mg-enriched defects is substantially suppressed by the UHPA. The dissolved Mg concentrations in the GaN matrix for both the conventional and the UHPA samples are almost of the same value, approximately 2 × 1018 cm−3; however, the UHPA sample shows over one order of magnitude stronger intensity of donor–acceptor-pair emission than the conventional one. Thus, the implanted Mg is effectively activated as acceptors through the UHPA technique.