MICROWAVE DIELECTRIC PROPERTIES AND RAMAN SPECTROSCOPY OF SCHEELITE SOLID SOLUTION [(Li0.5Bi0.5)1-xCax]MoO4 CERAMICS WITH ULTRA-LOW SINTERING TEMPERATURES
MICROWAVE DIELECTRIC PROPERTIES AND RAMAN SPECTROSCOPY OF SCHEELITE SOLID SOLUTION [(Li0.5Bi0.5)1-xCax]MoO4 CERAMICS WITH ULTRA-LOW SINTERING TEMPERATURES
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DOI：
10.1142/s1793604710001354
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发表时间：
2010-12
影响因子：
1.3
通讯作者：
Di Zhou;Hong Wang;Qiuping Wang;Xinguang Wu;Jing Guo;Gao-qun Zhang;L. Shui;X. Yao;C. Randall;L. Pang;Han-chen Liu
中科院分区：
文献类型：
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作者：
Di Zhou;Hong Wang;Qiuping Wang;Xinguang Wu;Jing Guo;Gao-qun Zhang;L. Shui;X. Yao;C. Randall;L. Pang;Han-chen Liu
以[（Li0.5Bi0.5）1-xCax] MoO 4陶瓷为基础，在0.0 ≤ x ≤ 1.0范围内，采用固相反应法制备了白钨矿固溶体。高性能的微波介电性能在[（Li0.5Bi0.5）0.15Ca0.85] MoO 4陶瓷在760°C下烧结，相对介电常数为14.1，Qf值为24，000 GHz（10.0 GHz时），温度系数值为+10.7 ppm/°C，[（Li0.5Bi0.5）0.1Ca0.9] MoO 4陶瓷在850°C下烧结，相对介电常数为12.7，Qf值为41，300 GHz（在10.3 GHz下），温度系数值为-16.5 ppm/°C。利用X射线衍射、拉曼光谱和经典阻尼振子模型研究了样品的微波介电性能与结构的关系。
A Scheelite solid solution was formed based on [(Li0.5Bi0.5)1-xCax]MoO4 ceramics and prepared via a solid state reaction method in the range 0.0 ≤ x ≤ 1.0. High performance microwave dielectric properties were obtained in the [(Li0.5Bi0.5)0.15Ca0.85]MoO4 ceramic sintered at 760°C with a relative permittivity of 14.1, a Qf value of 24,000 GHz (at 10.0 GHz), and a temperature coefficient value of +10.7 ppm/°C and the [(Li0.5Bi0.5)0.1Ca0.9]MoO4 ceramic sintered at 850°C with a relative permittivity of 12.7, a Qf value of 41,300 GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/°C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.