Atomic Arrangement in Two-Dimensional Silica: From Crystalline to Vitreous Structures
Atomic Arrangement in Two-Dimensional Silica: From Crystalline to Vitreous Structures
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DOI：
10.1021/jp3062866
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发表时间：
2012-09-27
影响因子：
3.7
通讯作者：
Freund, Hans-Joachim
中科院分区：
文献类型：
--
作者：
Lichtenstein, Leonid;Heyde, Markus;Freund, Hans-Joachim
采用非接触原子力显微镜（nc-AFM）和扫描隧道显微镜（STM）研究了Ru（0001）上硅薄膜的玻璃区和结晶区原子结构。我们能够分辨出晶体和玻璃结构中Si和0原子的原子排列。我们讨论了膜的特征结构性质，如距离、方向和角度，并将我们的结果与体玻璃二氧化硅网络的实验和模拟进行了比较。发现二维玻璃体网络的有序度可延伸至2nm。
The atomic structure of vitreous and crystalline regions of a thin silica film on Ru(0001) was investigated using noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM). We were able to resolve the atomic arrangement of the Si and the 0 atoms in the crystalline and the vitreous structures. We discuss characteristic structural properties of the films, such as distances, orientations, and angles, and we compare our results to experiments and simulations of bulk vitreous silica networks. It was found that order in two-dimensional vitreous networks can extend up to 2 nm.