Characterization of high-quality polycrystalline diamond and its high FET performance
Characterization of high-quality polycrystalline diamond and its high FET performance
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DOI:
10.1016/j.diamond.2006.07.021
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发表时间:
2006-11
影响因子:
4.1
通讯作者:
K. Ueda;M. Kasu;Y. Yamauchi;T. Makimoto;M. Schwitters;D. Twitchen;G. Scarsbrook;S. Coe
中科院分区:
文献类型:
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作者:
K. Ueda;M. Kasu;Y. Yamauchi;T. Makimoto;M. Schwitters;D. Twitchen;G. Scarsbrook;S. Coe