Computed laminography for materials testing
Computed laminography for materials testing
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DOI：
10.1063/1.115771
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发表时间：
1996-06-10
影响因子：
4
通讯作者：
Arnold, W
中科院分区：
文献类型：
--
作者：
Zhou, J;Maisl, M;Arnold, W
我们开发了一种计算机断层扫描系统，用于使用 X 射线检查大型或扁平物体。通过这种新的分层摄影方法，仅需要对物体进行平移。 X 射线源和探测器都保持静止。对象横截面是根据对象运动期间获取的数字投影来重建的，并且使用众所周知的算法进行重建。通过使用微焦点 X 射线管和线探测器，可以以约 50 μm 的切片分辨率检查物体，而与物体尺寸无关。 (C) 1996 年美国物理研究所。
We have developed a computed laminography system for the inspection of large or flat objects using x rays. By this new laminographic method only a translation of the object is necessary. Both the x-ray source and the detector remain stationary. Object cross sections are reconstructed from digital projections taken during the object motions and for the reconstruction well-known algorithms are used. By use of a microfocus x-ray tube and a line detector, objects can be inspected with a slice resolution of about 50 mu m independent of he object size. (C) 1996 American Institute of Physics.