Impact of Aging on Template Attacks
Impact of Aging on Template Attacks
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DOI：
10.1145/3194554.3194638
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发表时间：
2018-05
期刊：
影响因子：
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通讯作者：
Naghmeh Karimi;S. Guilley;J. Danger
中科院分区：
文献类型：
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作者：
Naghmeh Karimi;S. Guilley;J. Danger
从信息论的角度来看，模板攻击是最强大的侧信道攻击。这次攻击分两个阶段进行。在第一阶段（训练）中，攻击者使用训练设备来估计目标中间计算的泄漏模型，然后在第二阶段（匹配）中利用这些模型从目标设备中提取秘密信息。训练阶段和匹配阶段之间的工艺变化和操作条件（如温度）的差异对攻击的成功概率有不利影响。当考虑到设备老化时，攻击成功的降级会加剧。由于老化，晶体管的电气规格会随着时间而变化。因此，如果训练设备和目标设备经历了不同的使用时间，则攻击将更加困难。由于老化退化受到操作条件和技术变化的高度影响，训练设备和目标设备之间的老化校准是困难的。本文研究了老化对模板攻击成功率的影响。我们特别关注NBTI和HCI的老化机制。我们在不同的温度和老化时间对PRESENT密码进行了几次攻击。我们的研究结果表明，如果训练设备和目标设备之间存在老化-持续时间不匹配，攻击将更加困难。
Template attack is the most powerful side-channel attack from an information theoretic point of view. This attack is launched in two phases. In the first phase (training) the attacker uses a training device to estimate leakage models for targeted intermediate computations, which are then exploited in the second phase (matching) to extract secret information from the target device. Process variation and discrepancy of operating conditions (e.g., temperature) between training and matching phases adversely affect the success probability of the attack. Attack-success degradation is exacerbated when device aging comes into account. Due to aging, electrical specifications of transistors change over time. Thereby, if the training and target devices have experienced different usage time, the attack will be more difficult. Aging alignment between training and target devices is difficult as aging degradation is highly affected by operating conditions and technological variations. This paper investigates the effect of aging on the success rate of template attacks. In particular, we focus on NBTI and HCI aging mechanisms. We mount several attacks on the PRESENT cipher at different temperatures and aging times. Our results show that the attack is more difficult if there is an aging-duration mismatch between the training and target devices.