On the feasibility of combining on-line-test and self repair for logic circuits
On the feasibility of combining on-line-test and self repair for logic circuits
复制标题
逻辑电路在线测试与自修复相结合的可行性探讨
DOI：
10.1109/ddecs.2013.6549814
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
H. Vierhaus
中科院分区：
文献类型：
--
作者：
T. Koal;Markus Ulbricht;P. Engelke;H. Vierhaus
通过使用纳米技术实现的集成电路和系统显示出已知和新的故障效应的组合，这会影响其可靠性和使用寿命，特别是在安全关键应用中。瞬态故障效应，如单粒子翻转和多粒子翻转（SEU和MEU），需要快速的错误检测和补偿。永久性故障可能由于一方面的早期寿命失效和另一方面的应力诱导的快速老化而发生。它们需要通过维修技术得到补偿，最好是使用“新”资源来更换有故障的功能单元。由于自修复通常不是一个快速的过程，并且在系统离线时需要额外的时间，因此在线故障补偿还必须捕获和处理在“热”操作期间发生的永久性故障。如果一方面独立地实现在线测试和误差补偿，另一方面独立地实现修复技术，则在冗余电路中产生的开销变得过高。因此，在下面的文章中，我们介绍了一个新的概念，逻辑设计，可以满足基本要求，在合理的成本使用灵活的冗余分配。
Integrated circuits and systems implemented by using nano-technologies show a combination of known and new faults effects, which affect their reliability and their operational life time, specifically in safety-critical applications. Transient fault effects such as single and multiple event upsets (SEUs and MEUs) require fast error detection and compensation. Permanent faults may occur due to early life time failures on one side and stress-induced rapid aging on the other hand. They need to be compensated by repair technologies, preferably using “fresh” resources for the replacement of faulty functional units. As self repair is typically not a fast process and requires extra time while the system is off-line, on-line fault compensation must also catch and handle permanent faults that occur during “hot” operation. If on-line-test and error compensation on one side and repair technologies on the other hand are implemented independently, the resulting overhead in redundant circuitry becomes prohibitively high. In the following paper we therefore introduce a new concept of logic design which can meet the essential demands at reasonable cost using a flexible allocation of redundancy.