Development of a Field Emission Electron Microscope
Development of a Field Emission Electron Microscope
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场发射电子显微镜的研制
DOI：
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发表时间：
1979
期刊：
影响因子：
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通讯作者：
T. Komoda
中科院分区：
文献类型：
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作者：
A. Tonomura;T. Matsuda;J. Endo;H. Todokoro;T. Komoda
研制了一种具有高稳定电子枪和照明系统的场发射电子显微镜。为了证明该显微镜的高性能，进行了几个实验。通过对300条菲涅耳条纹和3000条双棱镜条纹的测量，证明了该光束的亮度大于常规光束的亮度。此外，显微镜的单色性使色差的影响较小，并观察到了镍{220}面(1/2D2：O=0.62a)的半间距条纹。Key)tw<；fr=场发射：相干：晶格分辨率：电子双棱镜：
A field emission electron microscope with highly stabilized gun and illuminating system was developed. Several experiments were made to demonstrate the high performance of the microscope. The brightness of the beam was more than that of the conventional ones, which feature was demonstrated by taking 300 Fresnel fringes and 3,000 bi-prism fringes. Furthermore, monochromatic feature of the microscope makes the effect of chromatic aberration smaller and the half-spacing fringes of nickel {220} planes (1/2 d2:o=O.62A) were observed. Key )tw<fr=field emission: coherence: lattice resolution: electron bi-prism: