Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy
Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy
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DOI：
10.1063/1.2785115
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发表时间：
2007-09-17
影响因子：
4
通讯作者：
Kawata, Satoshi
中科院分区：
文献类型：
--
作者：
Yano, Taka-Aki;Ichimura, Taro;Kawata, Satoshi
作者开发了一种针尖增强近场拉曼显微镜，可以精确地调节金属针尖和样品分子之间的纵向距离。这是通过采用时间选通光子计数方案，使我们能够观察到指数衰减的近场拉曼强度与针尖样品的距离。指数衰减显示了尖端尖端附近的表面等离子体激元的局部化所产生的增强场的特性。该显微镜被应用于评估金属涂覆的尖端，并且还从衰减曲线调查在两个金属纳米结构之间的间隙处产生的场的限制。(c)2007年，美国物理学会。
The authors developed a tip-enhanced near field Raman microscope that can precisely regulate longitudinal distance between a metallic tip and sample molecules. This was done by employing a time-gated photoncounting scheme that enabled us to observe exponentially decaying near field Raman intensity with the tip-sample distance. The exponential decay shows a characteristic of the enhanced field generated by the localization of the surface plasmon polaritons near the tip apex. This microscope was applied to evaluate metal-coated tips and also to investigate confinement of the field generated at a gap between two metal nanostructures from the decay curves. (c) 2007 American Institute of Physics.