The second order diffraction efficiency measurements in the vacuum ultraviolet.

The second order diffraction efficiency measurements in the vacuum ultraviolet.
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DOI:
10.1364/oe.17.013187
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发表时间:
2009-07
期刊:
影响因子:
3.8
通讯作者:
Yi Qu;Shurong Wang;Zhenduo Zhang;Fu-tian Li
Yi Qu;Shurong Wang;Zhenduo Zhang;Fu-tian Li
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Yi Qu;Shurong Wang;Zhenduo Zhang;Fu-tian Li

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介绍了一种测量真空紫外二级衍射效率的简单方法。反射镜的光谱反射率将受到第二衍射级的影响,在没有滤光片的分光光度计系统中测量。二阶衍射效率可以从不同的光谱反射率值计算。测量系统采用氘灯和光电倍增管。二级衍射效率可在120 ~ 165 nm范围内测定。在161 nm处获得0.00579+/-11.9%的结果。
A simple method for measuring the second order diffraction efficiency in the vacuum ultraviolet (VUV) is described. Spectral reflectance of a mirror will be influenced by the second diffraction order, measured in a spectrophotometer system without filters. The second order diffraction efficiency can be calculated from the different spectral reflectance values. A deuterium lamp and a scintillated photomultiplier are used in the measurement system. The second order diffraction efficiency can be determined from 120 nm to 165 nm. The result of 0.00579+/-11.9% is obtained at 161 nm.