Footprints of deformation mechanisms during in situ x-ray diffraction: Nanocrystalline and ultrafine grained Ni
Footprints of deformation mechanisms during in situ x-ray diffraction: Nanocrystalline and ultrafine grained Ni
复制标题
原位 X 射线衍射过程中变形机制的足迹：纳米晶和超细晶镍
DOI：
--
复制
发表时间：
2005
期刊：
影响因子：
--
通讯作者：
M. Zehetbauer
中科院分区：
文献类型：
--
作者：
Z. Budrovic;S. Petegem;P. Derlet;B. Schmitt;H. Swygenhoven;E. Schafler;M. Zehetbauer
原位X射线衍射表明，在高压扭转合成的具有80nm相干散射畴尺寸的超细晶Ni中，在拉伸变形过程中仍然建立位错网络，而对于具有30nm相干散射畴尺寸的电沉积纳米晶金属，情况并非如此。同时，该技术首次显示了纳米晶和超细晶Ni之间的塑性变形过程中宏观应力调节的重要差异，例如流动应力降低的起源。
In situ x-ray diffraction demonstrates that in ultrafine grained Ni synthesized by high pressure torsion with a coherent scattering domain size of 80nm, a dislocation network is still built up during tensile deformation whereas this is not the case for electrodeposited nanocrystalline metals with a coherent scattering domain size of 30nm. Simultaneously, the technique shows for the first time important differences in macroscopic stress accommodation during plastic deformation between the nanocrystalline and ultrafine grained Ni, such as the origin of the reduction in flow stress.