Single- and Dual- Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors
Single- and Dual- Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors
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DOI：
10.1109/tmtt.2014.2337264
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发表时间：
2014-09-01
影响因子：
4.3
通讯作者：
Kissinger, Dietmar
中科院分区：
文献类型：
--
作者：
Nasr, Ismail;Nehring, Johannes;Kissinger, Dietmar
本文介绍了一种单双口全集成毫米波超宽带矢量网络分析仪。这两种电路均采用商用0.35-mSiGe：C技术实现，f(T)/f(Max)为170/250 GHz，覆盖50-100 GHz之间的八度频率带宽。这种芯片可以配置成测量外部设备的复杂散射参数，或者使用集成的毫米波介电传感器来确定不同材料的介电常数。这两款设备均基于外差架构，在整个设计频率范围内实现57-72.5分贝的接收器动态范围。每个芯片中包括两个集成频率合成器模块，能够生成所需的测试和本地振荡器毫米波信号。测量统计相位误差小于0.3。利用所提出的系统演示了不同材料介电性质变化的自动测量。单端口和双端口网络分析仪芯片的电流消耗分别为600 mA和700 mA，均采用3.3V单电源供电。
This work presents a single-and dual-port fully integrated millimeter-wave ultra-broadband vector network analyzer. Both circuits, realized in a commercial 0.35-mSiGe: C technology with an f(t)/f(max) of 170/250 GHz, cover an octave frequency bandwidth between 50-100 GHz. The presented chips can be configured to measure complex scattering parameters of external devices or determine the permittivity of different materials using an integrated millimeter-wave dielectric sensor. Both devices are based on a heterodyne architecture that achieves a receiver dynamic range of 57-72.5 dB over the complete design frequency range. Two integrated frequency synthesizer modules are included in each chip that enable the generation of the required test and local-oscillator millimeter-wave signals. A measurement statistical phase error lower than 0.3 is achieved. Automated measurement of changes in the dielectric properties of different materials is demonstrated using the proposed systems. The single-and dual-port network analyzer chips have a current consumption of 600 and 700 mA, respectively, drawn from a single 3.3-V supply.