Measurement of YBCO Thin Film Surface Resistance Using Coplanar Line Resonator Techniques From 20 MHz to 20 GHz
Measurement of YBCO Thin Film Surface Resistance Using Coplanar Line Resonator Techniques From 20 MHz to 20 GHz
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DOI：
10.1109/tasc.2007.899369
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发表时间：
2007-07
影响因子：
1.8
通讯作者：
Yi Wang;H. T. Su;F. Huang;M. Lancaster
中科院分区：
文献类型：
--
作者：
Yi Wang;H. T. Su;F. Huang;M. Lancaster
通过表征两个20 MHz高温超导谐振器的1000多个谐波，在20 MHz至20 GHz的宽而连续的频率范围内测量了YBCO薄膜的表面电阻。一个谐振器是基于传统的共面波导（CPW）和其他基于导体背衬CPW（CBCPW）。测量了品质因数和谐振频率。共面线的衰减和群延迟的估计和超导体的表面电阻提取使用传输线模型。研究了表面电阻的宽带频率特性。分析了实验误差的来源。本文还报道了一些温度依赖和功率依赖的测量结果。
The surface resistances of YBCO thin films are measured over a wide and continuous frequency range from 20 MHz to 20 GHz, by characterizing more than 1000 harmonics of two 20 MHz high-temperature superconductor resonators. One resonator is based on the conventional coplanar waveguide (CPW) and the other based on the conductor-backed CPW (CBCPW). The quality factors and resonant frequencies are measured. The attenuation and group-delays of the coplanar lines are estimated and surface resistances of the superconductors are extracted using a transmission-line model. The wideband frequency-dependence of the surface resistance is investigated. The sources of experimental errors are analyzed. This paper also reports some temperature-dependent and power-dependent measurement results.