Structural order in perfluoropentacene thin films and heterostructures with pentacene.
Structural order in perfluoropentacene thin films and heterostructures with pentacene.
复制标题
全氟并五苯薄膜的结构顺序和并五苯异质结构。
作者：
I. Salzmann;S. Duhm;G. Heimel;J. Rabe;N. Koch;M. Oehzelt;Y. Sakamoto;Toshiyasu Suzuki
利用同步加速器x射线衍射对SiO2上的全氟戊烯（PFP）薄膜进行互反空间映射，确定了一种新型的单斜薄膜相的晶体结构，其单晶胞参数为a = 15.76 +/- 0.02 a, b = 4.51 +/- 0.02 a, c = 11.48 +/- 0.02 a, β = 90.4 +/- 0.1度。此外，通过镜面和掠射x射线衍射、原子力显微镜和傅里叶变换红外光谱研究了PFP和并五苯(P)的层状和共沉积异质结构。对于生长在P衬底上的约三层单层PFP薄膜，发现晶格间距略有增加。相比之下，共沉积的P/PFP薄膜形成了一种新的混合晶体结构，没有可检测到的相分离程度。这些结果突出了这些技术上相关的分子异质结在有机电子学中应用的结构复杂性。
Synchrotron x-ray diffraction reciprocal space mapping was performed on perfluoropentacene (PFP) thin films on SiO2 in order to determine the crystal structure of a novel, substrate-induced thin film phase to be monoclinic with unit cell parameters of a = 15.76 +/- 0.02 A, b = 4.51 +/- 0.02 A, c = 11.48 +/- 0.02 A, and beta = 90.4 +/- 0.1 degrees . Moreover, layered and co-deposited heterostructures of PFP and pentacene (P) were investigated by specular and grazing-incidence x-ray diffraction, atomic force microscopy, and Fourier-transform infrared spectroscopy. For a ca. three-monolayers-thick PFP film grown on a P underlayer, slightly increased lattice spacing was found. In contrast, co-deposited P/PFP films form a new mixed-crystal structure with no detectable degree of phase separation. These results highlight the structural complexity of these technically relevant molecular heterojunctions for use in organic electronics.