Channel Models for Physical Unclonable Functions based on DRAM Retention Measurements
Channel Models for Physical Unclonable Functions based on DRAM Retention Measurements
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DOI：
10.1109/redundancy48165.2019.9003355
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发表时间：
2019-10
期刊：
影响因子：
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通讯作者：
Sven Müelich;Sebastian Bitzer;C. Sudarshan;C. Weis;N. Wehn;M. Bossert;R. Fischer
中科院分区：
文献类型：
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作者：
Sven Müelich;Sebastian Bitzer;C. Sudarshan;C. Weis;N. Wehn;M. Bossert;R. Fischer
物理不可克隆函数 (PUF) 是硬件原语，它利用制造过程中的变化产生的内在随机性来生成可用于安全生成和存储加密密钥的随机二进制序列（响应）。近年来，存储单元行为中存在的内在随机性被用于此目的。虽然 SRAM 是文献中最常选择的存储器类型，但 DRAM 的使用是在过去几年中出现的。在这项工作中，我们提出了两种方法来消除从 DRAM 中提取的二进制序列中的偏差。对于每种方法，我们都派生了一个通道模型，该模型捕获从 DRAM 重新提取响应时出现的不稳定性。尽管有关信道的知识在选择或设计纠错码时很有用，但在 PUF 的背景下常常被忽视。为了提供概念证明，我们使用通过利用 DRAM 的保留行为生成的数据。
Physical Unclonable Functions (PUFs) are hardware primitives, which exploit intrinsic randomness occurring from variations in manufacturing processes, to generate random binary sequences (responses) that can be used for secure generation and storage of cryptographic keys. In recent times, intrinsic randomness present in the behavior of memory cells is used for that purpose. While SRAM is the type of memory that has most often been chosen in literature, the use of DRAM has emerged during the last years. In this work, we propose two methods to remove the bias in binary sequences extracted from DRAM. For each method, we derive a channel model, which captures the instabilities that occur when re-extracting responses from DRAM. Although knowledge about the channel is beneficial when selecting or designing error-correcting codes, it is often neglected in the context of PUFs. To provide a proof of concept, we use data generated by exploiting the retention behavior of DRAM.