A three-dimensional numerical scheme for modeling discontinuous pinning at sharp edges using the Volume-of-Fluid method

A three-dimensional numerical scheme for modeling discontinuous pinning at sharp edges using the Volume-of-Fluid method
复制标题

DOI:
10.1016/j.jcp.2023.111986
复制
发表时间:
2023-02
期刊:
J. Comput. Phys.
影响因子:
--
通讯作者:
Ashish Pathak;W. Jin;M. Raessi
Ashish Pathak;W. Jin;M. Raessi
中科院分区:
其他
文献类型:
--
作者:
Ashish Pathak;W. Jin;M. Raessi

文献摘要

相似文献

我们提出了一种新的三维(3D)数值模拟的不连续接触线钉扎沿着尖锐的直边。所提出的计划是专为多相流求解器,依赖于体积的流体(VOF)的方法,虽然其基本概念可以扩展和应用到其他方法。根据VOF中的分段线性接口构造(PLIC)方法,通过根据钉扎阶段调整位于尖锐边缘附近的PLIC多边形的方向来模拟不连续钉扎。这是通过解决寻根问题和使用3D几何工具箱来实现的,其中前进接触角确定邻近尖锐边缘的数值单元中的临界体积分数。在我们的多相流求解器中实施所提出的方案,我们使用几个测试案例评估其性能,其中接触线钉扎效应占主导地位。为了证明该计划的有效性,我们提出了定量比较我们的结果在不同的网格分辨率和理论研究。此外,我们定量地表明,没有接触线钉扎的数值处理,模拟结果将是截然不同的。接触线钉扎在包括分离、光刻、透镜制造、微流体流动控制以及许多其它技术的若干技术中起关键作用。所提出的计划将有助于准确地捕捉钉扎效应的计算模拟这样的应用。
We present a novel three-dimensional (3D) numerical scheme for modeling the discontinuous contact line pinning along sharp straight edges. The proposed scheme is devised for multi-phase flow solvers that rely on the Volume-of-Fluid (VOF) method, although its fundamental concepts can be extended and applied to other methods. Following the Piecewise-Linear-Interface-Construction (PLIC) approach in VOF, the discontinuous pinning is modeled by adjusting the orientation of PLIC polygons located near a sharp edge according to the pinning stage. That is achieved by solving a root-finding problem and using a 3D geometrical toolbox, where the advancing contact angle determines critical volume fractions in numerical cells neighboring the sharp edge. Implementing the proposed scheme in our multi-phase flow solver, we assessed its performance using several test cases where contact line pinning effects dominate. To demonstrate the scheme's efficacy, we present quantitative comparisons of our results at various grid resolutions and with a theoretical study. Furthermore, we show quantitatively that without a numerical treatment of contact line pinning, the simulation results will be drastically different. Contact line pinning plays a critical role in several technologies including separation, lithography, lens fabrication, micro-fluidic flow control among numerous others. The proposed scheme will help to accurately capture the pinning effects in computational simulations of such applications.