THE USE OF CADMIUM TELLURIDE DETECTORS FOR THE QUALITATIVE-ANALYSIS OF DIAGNOSTIC-X-RAY SPECTRA
THE USE OF CADMIUM TELLURIDE DETECTORS FOR THE QUALITATIVE-ANALYSIS OF DIAGNOSTIC-X-RAY SPECTRA
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DOI：
10.1088/0031-9155/29/9/008
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发表时间：
1984-01-01
影响因子：
3.5
通讯作者：
BACCI, C
中科院分区：
文献类型：
--
作者：
DICASTRO, E;PANI, R;BACCI, C
介绍了一种用于评价在50-100 kV p范围内使用碲化镉（CdTe）探测器的X射线机的X射线谱的方法，该探测器具有低探测效率。由于K逃逸、康普顿散射等的存在，用这种探测器得到的脉冲高度分布不能代表真实的光子谱;使用蒙特卡罗方法评价这些效果。本文描述了在Univac 1100/82计算机上实现的剥离程序。作者的方法的有效性进行了测试，最后通过与实验结果与Ge探测器和文献中的数据进行比较，结果与发表的数据吻合良好。
A method is introduced for the evaluation of x-ray spectra from x-ray machines operating in the range 50-100 kV p using a cadmium telluride (CdTe) detector with low detection efficiency. The pulse height distribution obtained with this kind of detector does not represent the true photon spectra owing to the presence of K-escape, Compton scattering, etc.; these effects were evaluated using a Monte Carlo method. A stripping procedure is described for implementation on a Univac 1100/82 computer. The validity of the authors' method was finally tested by comparison with experimental results obtained with a Ge detector and with data from the literature; the results are in good agreement with published data.