Theoretical,and experimental study on junction temperature of packaged Fabry-Perot laser diode
Theoretical,and experimental study on junction temperature of packaged Fabry-Perot laser diode
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DOI：
10.1109/tdmr.2004.827834
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发表时间：
2004-06-01
影响因子：
2
通讯作者：
Park, SW
中科院分区：
文献类型：
--
作者：
Han, JH;Park, SW
针对激光二极管的长期可靠性问题，对激光二极管在高温下的特性进行了表征，以检测和筛选由内应力和光学不稳定性引起的初始失效。从理论上对1.55 μ m Fabry-Perot半导体激光器的结温进行了估算，采用解析法建立了半导体激光器的热传导模型，并利用材料的热阻进行了计算。在老化测试条件下，通过控制温度下的电流注入测量结温，验证了分析结果。
Characterization of laser diode at high temperature for the issue of long-term reliability to detect and screen the initial failures originated from internal stress and optical instability is performed. Estimation of junction temperature of 1.55 mum Fabry-Perot laser diode was theoretically approached by using thermal resistance of materials regarding the heat path from analytically modeling laser diode. Under the condition of burn-in test, experiments measuring the junction temperature with current injection at controlled temperature verify the result compared to that of analysis.