Modularized SPM-controller based on an FPGA for combined AFM and SMM measurements
Modularized SPM-controller based on an FPGA for combined AFM and SMM measurements
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DOI：
10.1109/marss.2016.7561716
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发表时间：
2016-07
期刊：
影响因子：
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通讯作者：
M. Wieghaus;Tobias Tiemerding;O. Haenssler;S. Fatikow
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文献类型：
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作者：
M. Wieghaus;Tobias Tiemerding;O. Haenssler;S. Fatikow
本文介绍了一种用于原子力显微镜（AFM）和扫描微波显微镜（SMM）联合测量的硬件/软件控制系统的设计与实现。该系统的目的是连接和控制现有的组件（例如，G.任何AFM扫描仪和矢量网络分析仪（VNA）），从而增强其功能。因此，该系统是高度模块化的设计。基板提供多个插槽，并具有预定义的背载接口，用于不同的I/O组件，如数模转换器（DAC）。使用现场可编程门阵列（FPGA）代替硬布线整个连接。一项评估表明，尽管该系统处于发展初期，但与最先进的系统相比，它具有优越性。
This paper presents the design and implementation of a hardware/software controller system for combined atomic force microscopy (AFM) and scanning microwave microscopy (SMM) measurements. The purpose of the system is to connect and control existing components (e. g. any AFM scanner and vector network analyzer (VNA)), thus enhancing their functionality. Therefore, the system is of highly modular design. The base board offers multiple slots with a predefined piggy-back interface for different I/O components like digital-to-analog converters (DAC). Instead of hardwiring the overall connections, an field programmable gate array (FPGA) is used. An evaluation shows the superiority of the system in comparison to the state-of-the-art, despite the early stage of development.