Temperature dependence of the free-exciton transition energy in zinc oxide by photoluminescence excitation spectroscopy
Temperature dependence of the free-exciton transition energy in zinc oxide by photoluminescence excitation spectroscopy
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DOI:
10.1063/1.1586977
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发表时间:
2003-07-15
影响因子:
3.2
通讯作者:
Giles, NC
中科院分区:
文献类型:
--
作者:
Wang, LJ;Giles, NC
Photoluminescence (PL) and photoluminescence excitation (PLE) spectroscopies are used to track the temperature dependence of the A exciton energy (E-XA) in undoped bulk ZnO crystals grown by the seeded-chemical-vapor-transport method. For T>150 K, the edge emission becomes broad as the A exciton recombination and its longitudinal-optical (LO) phonon replica become superimposed. We use PLE to determine the temperature dependence of E-XA by monitoring the broad green emission commonly observed in as-grown ZnO crystals, and thus have established the energy difference between the E-XA and PL emission peak energies. The PL emission at 3.26 eV at room temperature is shown to be offset by about 50 meV to lower energy than the actual E-XA transition. The temperature dependence of the energy difference between the E-XA and PL peaks is compared with predictions based on the lineshape function for the E-XA-LO recombination. At 300 K, the PL is predominantly composed of E-XA-LO recombination. Further, the temperature dependence of the E-XA transition energy can be described using standard expressions and the Debye and Einstein temperatures are found to be 700+/-30 and 240+/-5 K, respectively. The slope of the E-XA versus T curve for ZnO approaches a constant value of dE(XA)/dT=-0.35 meV/K near room temperature. (C) 2003 American Institute of Physics.