The current limits of the laser-acoustic test method to characterize low-k films
The current limits of the laser-acoustic test method to characterize low-k films
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DOI:
10.1016/j.mee.2005.07.073
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发表时间:
2005-12
影响因子:
2.3
通讯作者:
D. Schneider;S. Frühauf;S. Schulz;T. Gessner
中科院分区:
文献类型:
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作者:
D. Schneider;S. Frühauf;S. Schulz;T. Gessner