Surface kinetics in AlN growth: A universal model for the control of surface morphology in III-nitrides
Surface kinetics in AlN growth: A universal model for the control of surface morphology in III-nitrides
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DOI:
10.1016/j.jcrysgro.2015.12.022
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发表时间:
2016-03-15
影响因子:
1.8
通讯作者:
Sitar, Zlatko
中科院分区:
文献类型:
--
作者:
Bryan, Isaac;Bryan, Zachary;Sitar, Zlatko
AlN epitaxial thin films were grown on both vicinal (0001)-oriented native single crystal AlN substrates and AlN templates grown on vicinal (0001) -oriented sapphire to develop a surface kinetic framework for the control of surface morphology. A Burton, Cabrera, and Frank (BCF) theory-based model is formulated and utilized to understand the dependence of the surface kinetics on the vapor supersaturation, sigma, and substrate misorientation angle, alpha. The surface energy of the Al-polar surface of AlN was experimentally determined using BCF theory to be 149 +/- 8 meV/angstrom(2). The critical misorientation angle for the onset of step-bunching was determined to be similar to 0.25 degrees for a growth rate of 500 nm/h and temperature of 1250 degrees C. Transitioning from a surface with 2D nuclei to one with bilayer steps required a decrease in sigma or an increase in alpha, whereas the suppression of step-bunching required an increase in sigma or a decrease in alpha. (C) 2016 Elsevier B.V. All rights reserved.