Subsurface Damaged Layer Reduction with Atomic Force Microscope Scratch Nano Machinig on Optical fiber End Plane
Subsurface Damaged Layer Reduction with Atomic Force Microscope Scratch Nano Machinig on Optical fiber End Plane
复制标题
光纤端面原子力显微镜划痕纳米加工减少次表面损伤层
DOI:
--
复制
发表时间:
2014
期刊:
影响因子:
--
通讯作者:
T. Sato
中科院分区:
文献类型:
--
作者:
S. Matsui;S. Umemura;T. Sato