K-line X-ray fluorescence analysis of high-Z elements ☆
K-line X-ray fluorescence analysis of high-Z elements ☆
复制标题
高Z元素的K线X射线荧光分析☆
DOI：
10.1016/s0584-8547(98)00149-9
复制
发表时间：
1999
期刊：
影响因子：
--
通讯作者：
K. Sakurai
中科院分区：
文献类型：
--
作者：
M. Harada;K. Sakurai
描述了高能光子（通常为40-100keV）的x射线荧光分析。高z元素的k线测量具有常规x射线区l线分析所不具备的优势。通过各种激发方式的比较，发现强度足够、光谱分布适中的准单色光束最适合提高检测限。讨论了其他激励方法的性能和最近的实验趋势。
X-ray fluorescence analysis with high-energy photons (typically 40–100keV) is described. Measurement of K-lines from high-Z elements has attractive advantages, which are not available by L-line analysis in normal X-ray region. Through the comparison of excitation methods, it has been found that quasi-monochromatic beams with sufficient intensity and moderate spectral distribution are most suitable for improving the detection limit. Performances of other excitation methods and recent experimental trends are also discussed.