Far-reaching geometrical artefacts due to thermal decomposition of polymeric coatings around focused ion beam milled pigment particles: FAR REACHING FIB INDUCED ARTEFACTS
Far-reaching geometrical artefacts due to thermal decomposition of polymeric coatings around focused ion beam milled pigment particles: FAR REACHING FIB INDUCED ARTEFACTS
复制标题
由于聚焦离子束研磨颜料颗粒周围的聚合物涂层热分解而产生影响深远的几何伪影：影响深远的 FIB 诱导伪影
DOI：
10.1111/jmi.12367
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发表时间：
2016
影响因子：
2
通讯作者：
WANG, R.Y.
中科院分区：
文献类型：
--
作者：
RYKACZEWSKI, K.;MIERITZ, D.G.;LIU, M.;MA, Y.;IEZZI, E.B.;SUN, X.;WANG, L.P.;SOLANKI, K.N.;SEO, D.-K.;WANG, R.Y.
聚焦离子束和扫描电子显微镜（FIB‐SEM）仪器被广泛用于表征复合材料的纳米级成分，然而，它们在有机防腐蚀涂层分析中的应用受到限制。使用FIB研磨有机材料所引起的主要问题是在离子束撞击附近发生严重热损伤的可能性。最近的研究表明，通过对样品进行低温冷却以及低电流研磨和智能离子束控制，可以减轻许多聚合物的这种局部伪影。在这里，我们报告了意想不到的非本地化的文物，发生在FIB研磨的复合有机涂料与颜料颗粒。具体地说，我们表明，FIB研磨的着色聚硅氧烷涂层可以导致在基板内形成多个微观空隙，远至5 μm远离离子束的影响。我们使用进一步的实验和建模表明，空隙形成发生通过离子束加热的颜料颗粒，导致周围的聚硅氧烷的分解和蒸发。我们还确定了可缓解此问题的FIB铣削条件。
Focused ion beam and scanning electron microscope (FIB‐SEM) instruments are extensively used to characterize nanoscale composition of composite materials, however, their application to analysis of organic corrosion barrier coatings has been limited. The primary concern that arises with use of FIB to mill organic materials is the possibility of severe thermal damage that occurs in close proximity to the ion beam impact. Recent research has shown that such localized artefacts can be mitigated for a number of polymers through cryogenic cooling of the sample as well as low current milling and intelligent ion beam control. Here we report unexpected nonlocalized artefacts that occur during FIB milling of composite organic coatings with pigment particles. Specifically, we show that FIB milling of pigmented polysiloxane coating can lead to formation of multiple microscopic voids within the substrate as far as 5 μm away from the ion beam impact. We use further experimentation and modelling to show that void formation occurs via ion beam heating of the pigment particles that leads to decomposition and vaporization of the surrounding polysiloxane. We also identify FIB milling conditions that mitigate this issue.