Detectors-The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization
Detectors-The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization
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DOI：
10.1063/5.0026992
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发表时间：
2020-11-01
期刊：
影响因子：
6.1
通讯作者：
Kirkland, Angus, I
中科院分区：
文献类型：
--
作者：
MacLaren, Ian;Macgregor, Thomas A.;Kirkland, Angus, I
探测器是革命性的可能性，在扫描透射电子显微镜，因为出现的直接电子探测器，记录在一个高的量子效率和高帧速率。这允许针对扫描中的每个像素捕获整个后焦平面，并且处理数据集以揭示感兴趣的任何特征。这一进展有许多可能的用途，与理解材料和异质结构的纳米和原子尺度结构直接相关。这篇文章给出了我们对该领域当前状态的看法，以及它下一步可能走向的一些方向。首先，在给出其应用的两个具体例子之前，给出了在这一领域的最近的工作的更广泛的概述：一个是成像应变薄膜和另一个是成像的周期性变化沿着的光束方向作为一个结果，在外延薄膜中的有序结构的形成。其次是展望，提出了在这个迅速扩大的领域未来可能的方向。
Detectors are revolutionizing possibilities in scanning transmission electron microscopy because of the advent of direct electron detectors that record at a high quantum efficiency and with a high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset to be processed to reveal whichever features are of interest. There are many possible uses for this advance of direct relevance to understanding the nano- and atomic-scale structure of materials and heterostructures. This article gives our perspective of the current state of the field and some of the directions where it is likely to go next. First, a wider overview of the recent work in this area is given before two specific examples of its application are given: one is imaging strain in thin films and the other one is imaging changes in periodicity along the beam direction as a result of the formation of an ordered structure in an epitaxial thin film. This is followed by an outlook that presents future possible directions in this rapidly expanding field.