New atomic probes for dark matter detection: Axions, axion-like particles and topological defects
New atomic probes for dark matter detection: Axions, axion-like particles and topological defects
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DOI：
10.1142/s0217732314400070
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发表时间：
2014-12-07
影响因子：
1.4
通讯作者：
Flambaum, Victor V.
中科院分区：
文献类型：
--
作者：
Stadnik, Yevgeny V.;Flambaum, Victor V.
我们简要介绍了最近提出的轴子、类轴子伪标量粒子和拓扑缺陷暗物质的探测方案。我们主要关注使用原子和分子系统探测暗物质的可能性。对于轴子和轴子类粒子，这些方法是对正在进行的光子-轴子相互转换实验和天体物理观测的补充。对于拓扑缺陷，这些方法是对传统的基于引力特征的天体物理搜索方案的补充。
We present a brief overview of recently proposed detection schemes for axion, axion-like pseudoscalar particle and topological defect dark matter. We focus mainly on the possibility of using atomic and molecular systems for dark matter detection. For axions and axion-like particles, these methods are complementary probes to ongoing photon-axion interconversion experiments and astrophysical observations. For topological defects, these methods are complementary to conventional astrophysical search schemes based on gravitational signatures.