Quantitative sectioning and noise analysis for structured illumination microscopy.
Quantitative sectioning and noise analysis for structured illumination microscopy.
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DOI：
10.1364/oe.20.000403
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发表时间：
2012-01-02
期刊：
影响因子：
3.8
通讯作者：
Tkaczyk TS
中科院分区：
文献类型：
--
作者：
Hagen N;Gao L;Tkaczyk TS
结构照明(SI)长期以来一直被认为是一种获得切片显微图像的非定量技术。它缺乏定量结果，限制了SI切片用于定性成像实验，也限制了研究人员将SI与竞争的切片方法(如共焦显微镜)进行比较的能力。我们展示了如何修改标准的SI分割算法，使该技术定量化，并给出了计算切片图像中噪声的公式。结果表明，对于在物面上提供相同空间积分光子通量的照明源，对于相同的有效切片厚度，当调制对比度超过约0.09时，SI切片可以提供比同等设置的共焦显微镜更高的SNR图像。
Structured illumination (SI) has long been regarded as a nonquantitative technique for obtaining sectioned microscopic images. Its lack of quantitative results has restricted the use of SI sectioning to qualitative imaging experiments, and has also limited researchers’ ability to compare SI against competing sectioning methods such as confocal microscopy. We show how to modify the standard SI sectioning algorithm to make the technique quantitative, and provide formulas for calculating the noise in the sectioned images. The results indicate that, for an illumination source providing the same spatially-integrated photon flux at the object plane, and for the same effective slice thicknesses, SI sectioning can provide higher SNR images than confocal microscopy for an equivalent setup when the modulation contrast exceeds about 0.09.