Synthesis and Crystal Structure of a New Layered Carbide [Zr1.97Y0.03]Al4C5

Synthesis and Crystal Structure of a New Layered Carbide [Zr1.97Y0.03]Al4C5
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DOI:
10.1111/j.1551-2916.2008.02274.x
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发表时间:
2008-04
影响因子:
3.9
通讯作者:
K. Fukuda;Miyuki Hisamura;T. Iwata;S. Hashimoto;H. Nakano
K. Fukuda;Miyuki Hisamura;T. Iwata;S. Hashimoto;H. Nakano
中科院分区:
材料科学2区
文献类型:
--
作者:
K. Fukuda;Miyuki Hisamura;T. Iwata;S. Hashimoto;H. Nakano

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合成了一种新型层状碳化物[Zr1.97Y0.03] Al 4C 5,并用X射线粉末衍射(XRPD)、透射电子显微镜(TEM)和能谱(EDX)对其进行了表征。通过EDX测定原子比[Zr:Y],并使用Rietveld方法从实验室XRPD数据(CuKα1)中精炼晶体结构。晶体为三方晶系(空间群R3 m,Z=3),晶格尺寸a=0.331934(4)nm,c=4.09459(3)nm,V=0.390701(7)nm ~ 3。最终的可靠性指标为Rwp=10.29%(S=1.31),Rp= 7.45%,RB= 1.63%,RF= 1.04%。化合物显示出与NaCl型[Zr1.97Y0.03C3]薄板的共生结构,所述薄板由Al 4C 3型[AlC]层隔开。该材料与Zr 2 [Al3.56Si0.44]C5是同构的。
A new layered carbide, [Zr1.97Y0.03]Al4C5, has been synthesized and characterized by X-ray powder diffraction (XRPD), transmission electron microscopy, and energy-dispersive X-ray spectroscopy (EDX). The atom ratios [Zr:Y] were determined by EDX, and the crystal structure was refined from laboratory XRPD data (CuKα1) using the Rietveld method. The crystal is trigonal (space group R3m, Z=3) with lattice dimensions of a=0.331934(4) nm, c=4.09459(3) nm, and V=0.390701(7) nm3. The final reliability indices were Rwp=10.29% (S=1.31), Rp=7.45%, RB=1.63%, and RF=1.04%. The compound shows an intergrowth structure with NaCl-type [Zr1.97Y0.03C3] thin slabs separated by Al4C3-type [AlC] layers. This material is isostructural with Zr2[Al3.56Si0.44]C5.