A direct method to determine the chiral indices of carbon nanotubes
A direct method to determine the chiral indices of carbon nanotubes
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DOI：
10.1016/j.cplett.2005.04.016
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发表时间：
2005-06-07
影响因子：
2.8
通讯作者：
Qin, LC
中科院分区：
文献类型：
--
作者：
Liu, ZJ;Qin, LC
本文介绍了一种由碳纳米管的纳米束电子衍射图高精度确定碳纳米管的手性指数(u，v)的直接方法。该方法是一步法，可以快速准确地确定碳纳米管的手性指数。使用当代的电子显微镜，我们已经能够实现准确的手性指数，使我们能够毫不含糊地指定高达(30，30)的范围，对应于直径4.0 nm。作为该方法的说明，给出了两个单壁碳纳米管的手性指数测定的例子。(C)2005 Elsevier B.V.保留所有权利。
A direct method is described to determine the chiral indices (u, v) of a carbon nanotube from a nanobeam electron diffraction pattern of the nanotube with high accuracy. This method is a one-step procedure and allows rapid and precise assignment of the chiral indices of carbon nanotubes. Using a contemporary electron microscope, we have been able to achieve an accuracy that enables us to assign the chiral indices unambiguously up to the range of (30,30), corresponding to a diameter of 4.0 nm. Examples of determination of the chiral indices for two single-walled carbon nanotubes are presented as an illustration of the method. (c) 2005 Elsevier B.V. All rights reserved.