Measurement of OH (X2R) in immediate vicinity of dielectric surface under pulsed dielectric barrier discharge at atmospheric pressure using two geometries of laser-induced fluorescence
Measurement of OH (X2R) in immediate vicinity of dielectric surface under pulsed dielectric barrier discharge at atmospheric pressure using two geometries of laser-induced fluorescence
复制标题
使用激光诱导荧光的两种几何结构在大气压下脉冲介电阻挡放电下测量紧邻介电表面的 OH (X2R)
DOI：
10.1063/1.4870598
复制
发表时间：
2014
影响因子：
3.2
通讯作者：
and Nobuaki Negishi
中科院分区：
文献类型：
--
作者：
Yoshiyuki Teramoto;Hyun-Ha Kim;Atsushi Ogata;and Nobuaki Negishi
