Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
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DOI：
10.1016/j.apsusc.2015.05.027
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发表时间：
2015-09-15
影响因子：
6.7
通讯作者：
Weiter, M.
中科院分区：
文献类型：
--
作者：
Schmiedova, V.;Heinrichova, P.;Weiter, M.
本文讨论了有机薄膜复折射率的测定，其评价是用椭圆偏振光谱仪实现的。研究了Tr偶联的MDMO-PPV、PCDTBT和PCBTDPP聚合物与PC60BM和PC70BM富勒烯共混的薄膜。近年来，这些材料因其在光伏领域的潜在应用而受到广泛的研究。本文综述了上述纯材料及其混合物的折射率和消光系数的研究成果。根据Tauc-Lorentz模型对所获得的椭偏测量数据进行了评估。(C)2015爱思唯尔B.V.保留所有权利。
The article deals with determination of complex refractive indexes of organic thin films; the assessment was implemented by spectroscopic ellipsometry. Thin films of Tr-conjugated MDMO-PPV, PCDTBT, and PCBTDPP polymers blended with PC60BM and PC70BM fullerenes were subjected to investigation. Recently, these materials have intensively been studied for their potential application in photovoltaics. This article summarizes research findings on refractive indexes and extinction coefficients of the above studied pure materials and their mixtures. The obtained ellipsometric data were evaluated according to the Tauc-Lorentz model. (C) 2015 Elsevier B.V. All rights reserved.