Direct detection of evanescent electromagnetic waves at a planar dielectric surface by laser atomic spectroscopy
Direct detection of evanescent electromagnetic waves at a planar dielectric surface by laser atomic spectroscopy
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DOI：
10.1103/physreva.55.2406
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发表时间：
1997-03-01
影响因子：
2.9
通讯作者：
Sakurai, T
中科院分区：
文献类型：
--
作者：
Matsudo, T;Hori, H;Sakurai, T
利用波长为852.1 nm的Cs - D-2型激光光谱学测量了电磁波在平面介质表面的穿透深度和伪动量（波矢量）。所有实验均采用相同的实验装置。第一个结果显示了一个尖锐的、不对称的吸收曲线。这是根据薄穿透深度来解释的，第二个显示了表面电磁模式的伪动量通过共振相互作用向原子的实际转移。测得的穿透深度和赝动量与平面介电-蒸汽界面上表征倏逝波的复波数的自然解释一致。被激发的铯原子直接激发倏逝波也被观察到，原子荧光以全内反射角发射到介电材料中。结果与理论预测吻合较好，并表现出激发转移或从Cs原子隧穿到表面模式的特征。
The penetration depth and pseudomomentum (wave vector) of evanescent electromagnetic waves are measured at a planar dielectric surface by means of laser spectroscopy using the Cs D-2 Lint with a wavelength of 852.1 nm. The same experimental setup is employed in all the experiments. The first result shows a sharp, asymmetric absorption profile. which is explained in terms of the thin penetration depth, and the second shows an actual transfer of the pseudomomentum of the surface electromagnetic mode to atoms via a resonance interaction. The measured penetration depth and pseudomomentum agree with the natural interpretation of the complex wave number characterizing evanescent waves at a planar dielectric-vapor interface. Direct excitation of evanescent waves by excited Cs atoms has also been observed as atomic fluorescence emitted into the dielectric material at the angle of total internal reflection. The results are in good agreement with the theoretical predictions and exhibit the characteristics of excitation transfer or tunneling from Cs atoms into the surface mode.