Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation
Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation
复制标题
基于结构的多周期顺序观察测试下故障检测强化FF的选择方法
DOI：
10.1109/ats.2016.40
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Jun Matsushima
中科院分区：
文献类型：
--
作者：
Senling Wang;Hanan T. Al-Awadhi;Soh Hamada;Yoshinobu Higami;Hiroshi Takahashi;Hiroyuki Iwata;Jun Matsushima
基于内建自测试的现场测试是保证智能系统和自治系统功能安全的一种有效方法。为了提高内建自测试的故障覆盖率，减少随机模式，在多周期测试中顺序观察一些触发器（FF）是有用的。在本文中，我们提出了在多周期测试中通过评估电路结构来选择故障检测增强型FF的方法。ITC99基准测试和一个真实的电子控制单元（ECU）电路的实验结果表明，所提方法在提高故障覆盖率和减少随机模式方面是有效的。
BIST based field testing is a promising way to guarantee the functional safety of intelligent and autonomous systems. To improve the fault coverage with less random patterns for BIST, sequentially observing some flip-flops(FFs) during multi-cycle test is useful. In this paper, we propose the methodology for selecting the Fault-Detection-Strengthened FFs in multi-cycle test by evaluating the structure of a circuit. The experimental results of ITC99 benchmarks and a real Electronic Control Unit (ECU) circuit show the effectiveness of the proposed methods in fault coverage improvement and random pattern reduction.