Radiation Hardening of Voltage References Using Chopper Stabilization
Radiation Hardening of Voltage References Using Chopper Stabilization
复制标题
使用斩波稳定的电压基准的辐射硬化
DOI：
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发表时间：
2015
影响因子：
1.8
通讯作者：
L. Massengill
中科院分区：
文献类型：
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作者：
K. J. Shetler;N. Atkinson;W. Holman;J. Kauppila;T. D. Loveless;A. Witulski;B. Bhuva;E. Zhang;L. Massengill
提出了一种提高电离辐射环境下基准电压源精度的方法。辐射引起的失配被确定为基准电压源拓扑中的基本误差源，斩波器失调抵消被用来减轻这种影响。所提出的技术的有效性证明了通过照射在商业180 nm工艺制造的测试芯片。
A technique for enhancing the precision of voltage references in an ionizing radiation environment is presented. Radiation-induced mismatch is identified as a fundamental source of error in voltage reference topologies, and chopper offset cancellation is used to mitigate the effect. The efficacy of the proposed technique is demonstrated by irradiating test chips fabricated in a commercial 180-nm process.