Structural investigation of InAs nanowires with coherent X-rays
Structural investigation of InAs nanowires with coherent X-rays
复制标题
用相干 X 射线研究 InAs 纳米线的结构
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
S. Labat
中科院分区：
文献类型：
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作者：
V. Chamard;Antonio F. Díaz;Julian Stangl;S. Labat
为了理解和监测新的物理性质，对纳米晶体内部结构的详细了解是非常重要的。然而，实验表征仍然具有挑战性。第三代同步加速器相干X射线源的发展打开了新的可能性，这是基于具有内部纳米晶体位移场的相干光束的高灵敏度。本文旨在说明相干X射线布拉格衍射用于晶体缺陷研究和无透镜的形貌和应变成像。用这两种方法对InAs纳米线样品进行了表征。在纳米晶体应变分析的框架内讨论了该方法的局限性和近期的前景。
Detailed knowledge of the internal structure of nanocrystals is of major importance in order to understand and monitor new physical properties. However, the experimental characterization remains challenging. The development of coherent X-ray sources at third-generation synchrotrons opens new possibilities based on the high sensitivity of the coherent beam with the internal nanocrystal displacement field. This paper aims at illustrating the use of coherent X-ray Bragg diffraction for crystalline defect investigation and lens-less imaging of morphology and strain. The two approaches are used to characterize an InAs nanowire sample. Limits of the method and near-future perspectives are discussed in the framework of strain analysis in nanocrystals.