Integration of antiferromagnetic Heusler compound Ru2MnGe into spintronic devices
Integration of antiferromagnetic Heusler compound Ru2MnGe into spintronic devices
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DOI:
10.1063/1.4985179
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发表时间:
2017-07-17
影响因子:
4
通讯作者:
Reiss, Guenter
中科院分区:
文献类型:
--
作者:
Balluff, Jan;Huminiuc, Teodor;Reiss, Guenter
We report on the integration of an antiferromagnetic Heusler compound acting as a pinning layer into magnetic tunneling junctions (MTJs). The antiferromagnet Ru2MnGe is used to pin the magnetization direction of a ferromagnetic Fe layer in MgO based thin film tunneling magnetoresistance stacks. The samples were prepared using magnetron co-sputtering. We investigate the structural properties by X-ray diffraction and reflection, as well as atomic force and high-resolution transmission electron microscopy. We find an excellent crystal growth quality with a low interface roughnesses of 1-3 angstrom, which is crucial for the preparation of working tunneling barriers. Using Fe as a ferromagnetic electrode material, we prepared magnetic tunneling junctions and measured the magnetoresistance. We find a sizeable maximum magnetoresistance value of 135%, which is comparable to other common Fe based MTJ systems. Published by AIP Publishing.