High-resolution magnetic field measurement using an STM-SQUID
High-resolution magnetic field measurement using an STM-SQUID
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使用 STM-SQUID 进行高分辨率磁场测量
DOI：
10.1016/j.phpro.2012.06.163
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
H. Itozaki
中科院分区：
文献类型：
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作者：
N. Watanabe;Y. Miyato;M. Tachiki;T. Hayashi;D. He;H. Itozaki
我们开发了一种STM - SQUID显微镜，该显微镜结合了扫描隧道显微镜（STM）和SQUID探针显微镜，用于高分辨率磁场测量。通过将SQUID探针显微镜上的针尖抛光至100nm以下，并使用磁探头作为磁导作为STM探针，我们可以获得1μm以下的空间分辨率。在这项研究中，我们使用STM-SQUID显微镜对典型的铁磁性材料，如块状铁和块状镍进行了磁成像。我们成功地观察到了这些磁性材料的磁畴结构。然而，由于样品的背景磁场，在STM-SQUID图像中也观察到地形伪影。解决和质量改进的未来主题变得清晰起来。
We have developed an STM–SQUID microscope that combined a scanning tunneling microscope (STM) and a SQUID probe microscope for the purpose of high–resolution magnetic field measurement. We were able to obtain a spatial resolution of 1μm or less by polishing the tip of the needle on the SQUID probe microscope to 100nm or less, and by using a magnetic probe, which was the flux guide, as the STM probe. In this study, we took magnetic images of typical ferromagnetic materials, such as bulk iron and bulk nickel using the STM–SQUID microscope. We successfully observed the magnetic domain structures of these magnetic materials. However, topographic artifacts were also observed in the STM–SQUID images due to the background magnetic field from the sample. The future subject for resolution and quality improvement became clear.