Ballistic thermal conductance of a lab-in-a-TEM made Si nanojunction.
Ballistic thermal conductance of a lab-in-a-TEM made Si nanojunction.
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DOI：
10.1021/nl302379f
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发表时间：
2012-10
期刊：
影响因子：
10.8
通讯作者：
L. Jalabert;T. Sato;T. Ishida;H. Fujita;Y. Chalopin;S. Volz
中科院分区：
文献类型：
--
作者：
L. Jalabert;T. Sato;T. Ishida;H. Fujita;Y. Chalopin;S. Volz
一个单一的硅纳米结的热导率测量的基础上的实验室在一个TEM（微机电系统在透射电子显微镜）技术，并被发现是至少2个数量级以上的长纳米线在380-460 K的温度范围。弹道声子输运的优势似乎是最好的假设，以检索定量预测，尽管结的几何不规则性。该测量基于MEMS结构，该MEMS结构包括静电致动器，该静电致动器允许以基于透射电子显微镜的分辨率的精度产生纳米结。通过两个集成电阻器测量热导率，这两个电阻器同时加热并测量最近的纳米结处的局部温度。短纳米结的相当大的热导率构成了一个新的关键因素，在纳米系统的设计和机械微纳米接触的破坏的理解。这种导电行为也为纳米级冷却装置以及最近的声子信息技术的发展铺平了道路。
The thermal conductance of a single silicon nanojunction was measured based on a Lab-in-a-TEM (microelectromechanical systems in a transmission electron microscope) technique and was found to be at least 2 orders of magnitude larger than the ones of long nanowires in the 380-460 K temperature range. The predominance of ballistic phonon transport appears as the best hypothesis to retrieve quantitative predictions despite the geometrical irregularity of the junction. The measurement is based on a MEMS structure including an electrostatic actuator that allows producing nanojunctions with the accuracy based on the resolution of a transmission electron microscope. The thermal conductance is measured by two integrated resistors that are simultaneously heating and measuring the local temperatures at the nearest of the nanojunction. The considerable thermal conductance of short nanojunctions constitutes a new key element in the design of nanosystems and in the understanding of the damaging of mechanical micronanocontacts. This conducting behavior is also paving the way for the development of nanoscale cooling devices as well as of the recent phononic information technology.