Field Effect Transistors for Terahertz Detection: Physics and First Imaging Applications
Field Effect Transistors for Terahertz Detection: Physics and First Imaging Applications
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DOI:
10.1007/s10762-009-9564-9
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发表时间:
2009-12-01
影响因子:
2.9
通讯作者:
Otsuji, Taiichi
中科院分区:
文献类型:
--
作者:
Knap, Wojciech;Dyakonov, Mikhail;Otsuji, Taiichi
Resonant frequencies of the two-dimensional plasma in FETs increase with the reduction of the channel dimensions and can reach the THz range for sub-micron gate lengths. Nonlinear properties of the electron plasma in the transistor channel can be used for the detection and mixing of THz frequencies. At cryogenic temperatures resonant and gate voltage tunable detection related to plasma waves resonances is observed. At room temperature, when plasma oscillations are overdamped, the FET can operate as an efficient broadband THz detector. We present the main theoretical and experimental results on THz detection by FETs in the context of their possible application for THz imaging.